Lumere LC (led test system)
Lumere LC (led test system)
Lumere LC (led test system)
Lumeresoft led test system

Lumere LC (LED Test System)

Lumere LC is a LED test and measurement system (spectroradiometer) for various parameters of LED light. It is economical, its optical measurement is conform with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs. The system can be coupled with a baffle tube Condition A or B for luminous intensity measurement or an Integrating Sphere for luminous flux measurement. Standard sphere sizes of 8”, 6”, and 4”, as well as custom sizes, are available.

A high accuracy source meter is used to power the LED to perform all electrical tests and measurements. Different range of Source meter can be selected based on the requirement. Lumere can be combined with LumereSoft software, specifically designed for the LED production environment. It controls the Spectroradiometer and Source Meter and provides the LED binning information via Digital I/O, RS-232, GPIB, Centronics and more.

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Machine Overview

LED Test System

  1. IPC – Windows Embedded
  2. Spectrometer
  3. Source Meter
  4. Optical Accessories

Advantages

One Stop Software Solution For

Electrical Testing
Voltage
Current
Resistance
Capacitance
Optical Testing
Colorimetry
Photometry
Radiometry
Binning
ANSI BIN
MacAdam BIN

Wide Range of Hardware Integration Support

Array Spectroradiometers;

Brands supported includes Instrument Systems, Gamma Scientific, OTO, Avantes, etc.

Power Source(e.g Source meter, AC/DC Meter, Measuring Meter) from Keithley, National instrument, Vektrex, etc.

Integrating Sphere & Optical Probes

Wide Range of Testing Communication Protocol Support

I²C

SWIM

BLE

RS232

SPI

TCPIP

USB

Flexible and Comprehensive

  • For integrated to manual station for engineering purposes
  • Easily integrated into fully automated equipment for production through various handshaking protocol

Powerful Test Editor For Recipe Creation

  • Single / Multiple Chips Testing Mode
  • Series / Parallel Test Mode for High Speed machines
  • Color Binning based on ANSI or MacAdam

Production SPC/ Monitoring Control

Real Time acquisition and Data Analysis display

Systematic Data Management

Recommended geometry according to CIE Pub. No. 127

Test time < 90 msec (Near real-time optical measurement)

High sensitivity 2048 pixel CMOS array sensor

NIST- or PTB-traceable calibrations

Advanced binning management for up to 1024 bins

User friendly, scalable test software with flexible, programmable test flows

Applicable Products

Application in Sectors

Sector1

Automation Lighting

Sector2

General Lighting

Sector3

Illumination Lighting

Sector4

Smartphone Lighting

Sector5

Smart Device Lighting

Sector6

Horticulture Lighting

Applications ：OptoSemiconductors

Opto1

Sensors

Opto2

Photo Diode

Opto3

Photo IC

Opto4

Ambient Light Sensors

Opto5

Emitter

Applications: Package Type

package1

SMD

package2-01

COB Singulated

package3-01

Panel Board

package4-01

Camera Flashes

package5-01

Copper Board

package6-01

Module

package7-01

Lead Frame

package8-01

Light Sheet

package9-01

TO-5

In House Design Customize Circuit Board

Circuit1

Multiplexer / Matrix Relay Board

Circuit2

High Current Relay Board

Circuit3

Functional Test Board

Circuit4

ADC / DAC Board

Probe Card and Test Socket

Parameter

Electrical Measurement

  • Forward / Reverse Voltage Test
  • Forward / Reverse Current Test
  • Open / Short Test
  • Leakage Test
  • Contact Check
  • NTC Test
  • Resistance Test
  • Capacitance Test

Optical Measurement

Colorimetry

  • CIExy1931
  • CIExy2015
  • CIE Lab* Luv*
  • Trist X,Y,Z
  • CRI (Ra,R1-R16)
  • Color Temperature
  • Color Purity
  • Color Gamut
  • Color Fidelity
  • Color Quality Scale
  • Duv

Photometry

  • Luminous Flux
  • Luminous Intensity
  • Illuminance
  • Luminous Efficacy
  • Photon

Radiometry

  • Radiant Flux
  • Radiant Intensity
  • Radiance
  • Irradiance

Wavelength

  • Peak Wavelength
  • Centroid Wavelength
  • Dominant Wavelength
  • FWHM

Others

  • Photosynthetic Photon Flux (PPF)
  • Biologically-Active Photon Flux (BPF)
  • Active PPF (A-PPF)
  • Absolute Spectral Distribution (ASD)

Specification

 

Parameter Basic Spectrometer
Optical Measurement Spectral Range 350-1020nm
Detector Sony ILX511B CCD Array, 2048 Pixel
Resolution 1.62nm
Photometric Measurement (Intensity/ Flux) Accuracy Flux / Intensity +/- 3%
Reproducibility of Single System +/- 1%
Measurement Range Intensity (10:1 SNR) 0.004mcd – 2000mcd
Flux (10:1 SNR) 0.1lm – 5klm
Photometric Measurement (Intensity/ Flux) Accuracy Flux / Intensity +/- 3%
Reproducibility of Single System +/- 1%
Colorimetric Measurement Accuracy Peak Wavelength +/- 0.3 nm
Dominant Wavelength +/- 2 nm
Chromaticity Color Coordinates (x,y) +/- 0.005
Color Correlated Temperature (CCT) +/- 2%
Sensitivity Luminous Intensity (10:1 s:n) 0.004mcd – 2kcd
Luminous Flux (10:1 s:n) N/A
Illuminance Sensitivity (10:1 SNR) 0.1lux – 50klux
Measuring Time 1ms – 65s
Measuring Time at 1mcd (10:1 SNR) 40ms
Dynamic Range 1300:1
Signal to Noise Ratio (SNR) 250:1
Stray Light <0.15% @ 450nm